Dielectric properties and impedance spectroscopy of NASICON type Na3Zr2Si2PO12

We report the temperature dependent dielectric properties and impedance spectroscopy investigation of Na3Zr2Si2PO12 in frequency range 20 Hz–2 MHz. The Rietveld refinement x-ray diffraction pattern confirms monoclinic phase with C2/c space group. d.c. resistivity behavior shows its strong insulating nature at low temperatures, follows Arrhenius law thermal conduction an activation energy 0.68 eV. Moreover, detailed analysis I–V data a transition from ohmic to charge limited (SCLC) mechanism around 5 V applied electric field. decrease permittivity (?r) is explained based on polarization increment by carriers. loss (D = tan?) peak 0.25 observe enhancement a.c. conductivity due energy, which results enhancing between defect states. Further, we abrupt increase high frequencies, using universal Jonschers power law. two types mechanisms namely correlated barrier hopping non-overlapping small polaron tunnelling measured range. imaginary part modulus non-Debye type relaxation sample. shifting towards higher side ensures thermally activated nature. scaling similar over combined short-range mobility